WITec’s RISE system for correlative Raman–scanning electron microscopy is now compatible with Zeiss’ Merlin SEM. The combined system maintains all functions and features of a stand-alone Zeiss SEM and a WITec confocal Raman microscope. In Raman imaging mode the sample can be scanned through a range of 250 × 250 × 250 µm3. The microscope enables software-driven switching between Raman imaging and SEM, transformation of the Raman spectra into an image and the ability to overlay both images to produce the RISE image.