SPECTRO Analytical Instruments has announced a new version of the SPECTRO ARCOS inductively coupled plasma optical emission spectrometer. The enhancements in the new SPECTRO ARCOS have come from customer input and advances in proven technologies. The new dual side-on interface (DSOI) version features two optical interfaces which adds sensitivity and eliminates contamination/matrix compatibility issues that can plague vertical-torch dual-view models. If the DSOI is not needed, a standard SPECTRO ARCOS side-on plasma (SOP) version features a dedicated radial, single side-on interface. Users select either high-sensitivity axial plasma observation for trace analysis or radial plasma observation for high matrix loads and organic solutions. The latter option includes a periscope-free MultiView version that enables operators to literally “turn” SPECTRO ARCOS from true radial view into true axial view, or vice versa, in 90 s. With the DSOI option, MultiView becomes even more versatile, offering added sensitivity for the radial mode. The ARCOS has new CMOS detectors, which eliminate blooming and can read low signals from trace elements even in the vicinity of intense matrix lines. Additionally, they offer a high dynamic range and eliminate on-chip cooling.
The new SPECTRO ARCOS is available in six versions, depending on choices of plasma viewing technology and elemental wavelength range. Available options include a SPECTRO Intelligent Valve System upgrade kit and a portable video camera for remote monitoring.
