Tim S. Brewer and Peter K. Harvey
Department of Geology, University of Leicester, Leicester, LE1 7RH, UK. E-mail: tsb5@le.ac.uk
Rate this Article
Technique:
X-ray fluorescence spectrometry: a fast and versatile technique for the analysis of geological samples
![Illustration of a thin film solar cell based on a CIGS [Cu(In,Ga)Se2] absorber layer](/sites/default/files/styles/thumbnail/public/articles/Thin_Film_30-1_F1w.jpg?itok=oNor7cmJ)
