Rigaku Corporation has introduced the new Rigaku ZSX Primus 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer. The new instrument has been designed specifically to handle very large and/or heavy samples and offers micro-mapping capabilities. The spectrometer accepts samples up to 400 mm diameter, 50 mm thick and 30 kg mass, making it suitable for analysing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples. All the analytical capabilities of a traditional instrument are retained in this “large sample” variant, including measurement of beryllium (Be) through uranium (U) with high-resolution and precise WDXRF spectroscopic examination of samples from solids to liquids and powders to thin films.
A customised sample adapter system has a variable measurement spot (30–0.5 mm diameter with five-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity. A real-time camera allows the analysis point to be viewed on-screen, offering the operator complete certainty as to what is being measured.
The ZSX Primus 400 Windows-based software is user-friendly, yet powerful enough for the most complex analysis. Based on the Rigaku easy-to-use flow bar interface, the ZSX Guidance software walks the user through the steps required to set up an empirical or fundamental parameters application.
