HORIBA Scientific have expanded their XGT-9000 series product line with the release of the two new micro-XRF (X-ray fluorescence) analysers, the XGT-9000 Pro and XGT-9000 Expert. These have improved detection systems and a patented pulse processing algorithm to achieve higher-speed analysis. Additionally, the XGT-9000 Expert has light element analysis (down to boron) in a benchtop energy dispersive micro-XRF analyser. The ability to analyse supersensitive light elements, such as carbon (C), nitrogen (N) and oxygen (O) allows the analyses of oxides, nitrides, organic matter and other materials by a single micro-XRF analyser.
Further, with the increasing importance of quality control in manufacturing process, the detection of tens of microns-sized contaminants or foreign matter, which are difficult to visually recognise, has been a challenge. This is because even a microscopic contaminant can result in lower performance and other serious problems in products. That is why micro-XRF analysers are becoming more essential than ever before.
While micro-XRF analysers are powerful for the analysis of inorganic materials and metals, high-sensitivity analyses of light elements below sodium (Na) have generally been difficult for them up until now. The analysis of nitrides and organic matter had required a different type of analyser. The ability of the XGT-9000 Expert to achieve high-sensitivity analyses of light elements such as carbon (C), nitrogen (N) and oxygen (O), allows a single instrument to provide a way to analyse not only metals, but also oxides, nitrides and organic matter.