The new Vanta Element-S handheld X-ray fluorescence (XRF) analyser provides fast light element detection at an affordable price, adding to the family of entry-level Vanta Element XRF instruments. The S model is equipped with a silicon drift detector (SDD) to analyse light elements such as magnesium (Mg), aluminium (Al), silicon (Si), sulfur (S) and phosphorus (P) in alloys. It is suitable for scrap recycling, basic PMI, metal manufacturing and precious metals, measuring ferrous metals, aluminium, copper, stainless steel, nickel and gold karats. The analyser offers on-screen grade ID and comparison for the light elements Mg, Al and Si in seconds. Its SDD detector can distinguish similar alloy grades such as 303 stainless steel from 304, and aluminium 6061 or 6063 from 1100.
The Vanta Element-S weighs 1.32 kg and is IP54-rated to resist dust and moisture and built to pass a 1.2 m drop test (MIL-STD-810G) to help protect from the occasional drop or jostle. Other protective features include a stainless-steel faceplate and a Prolene® window with Kapton® mesh support that easily sticks on and peels off for tool-less window changes in the field. Optional wireless connectivity is available, and users can connect to the Olympus Scientific Cloud™ for wireless data sharing and access to convenient fleet management tools, as well as the Olympus mobile app or the company network. The analyser also has a 1-GB microSD™ card to store results and two USB ports to export data.
