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Articles and Columns
Qualifying calibration samples for advanced thin film materials characterisation
7 Feb 2018
Fast and versatile ambient surface analysis by plasma-assisted desorption/ionisation mass spectrometry
8 Dec 2015
Infrared mapping spectroscopic ellipsometry
1 Jun 2015
Latest News
Interpretation of spectra can be data-driven using machine learning
10 Sep 2018
Electron spectrometer deciphers quantum mechanical effects
2 Aug 2018
Raman spectroscopy in battery research
16 Jan 2018
Latest Products
Multi-technique surface analysis system
26 Sep 2017
Uvisel Plus reference ellipsometer for thin film measurements
11 Jul 2017
RBD Instruments Unveils New Analyser for Auger Electron Spectroscopy
20 Nov 2015
Latest Events
European Winter Conference on Plasma Spectrochemistry-EWCPS-2019
3 February 2019
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8 February 2019
Pau, France
ARABLAB 2019
12 March 2019
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14 March 2019
Dubai, United Arab Emirates
Pittcon 2019-Conference on Analytical Chemistry and Applied Spectroscopy
17 March 2019
to
21 March 2019
Philadelphia, United States
![Illustration of a thin film solar cell based on a CIGS [Cu(In,Ga)Se2] absorber layer](http://spectroscopyasia.com/sites/default/files/styles/photo-horizontal/public/articles/Thin_Film_30-1_F1w.jpg?itok=Tcu390Vt)
Pau, France
Philadelphia, United States