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Articles

 Illustration of a thin film solar cell based on a CIGS [Cu(In,Ga)Se2] absorber layer

Qualifying calibration samples for advanced thin film materials characterisation

Cornelia Streeck, Thomas Wirth, Wolfgang Unger, Burkhard Beckhoff

In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques.

Article  |  Issue 30/1 (2018)

Fast and versatile ambient surface analysis by plasma-assisted desorption/ionisation mass spectrometry

Frank J.M. Rutten, Jasim M.S. Jamur, Paul Roach

This article tells us about another: “Fast and versatile ambient surface analysis by plasma-assisted desorption/ionisation mass spectrometry”. They show that surface analysis can greatly benefit from approaches using surface–plasma interactions and that PADI shows significant promise to become a valuable and versatile tool for this.

Article  |  Issue 27/6 (2015)

Infrared mapping spectroscopic ellipsometry

Karsten Hinrichs, Andreas Furchner

The authors describe “Infrared mapping spectroscopic ellipsometry”. Recent developments in fundamental and materials research have increased the value of mapping techniques such as ellipsometry. IR ellipsometry, since it operates in the mid-IR fingerprint region, provides complementary information on composition, structural properties and interactions

Article  |  Issue 27/3 (2015)

G-SIMS: a powerful method for simplifying and interpretation of complex secondary ion mass spectra

Ian S. Gilmore, Satoka Aoyagi, Ian W. Fletcher, Martin P. Seah

A complication and barrier to wider uptake of SIMS, especially for organic materials, is the complexity of the mass spectrum. The G-SIMS method (from gentle-SIMS) was developed to simplify the spectra and provide direct interpretation based on the physics and chemistry of the SIMS process rather than on statistical analysis techniques such as principal component analysis or library matching methods.

Article  |  Issue 24/6 (2012)

Molecular imaging by mass spectrometry: application to forensics

Tiffany Porta, Emmanuel Varesio, Thomas Kraemer, Gérard Hopfgartner

After an introduction to MALDI, DESI and SIMS, the authors describe their main applications in forensics, as well as the advantages provided in terms of sample preparation over approaches routinely used in toxicological laboratories.

Article  |  Issue 23/5 (2011)

Secondary neutral mass spectrometry: a powerful technique for quantitative elemental and depth profiling analyses of nanostructures

Kálmán Vad, Attila Csik, Gábor A. Langer

The purpose of this article is to give a comparative description of two methods applying ion-beam sputtering in materials research: secondary ion and neutral mass spectrometries (SIMS and SNMS). We shall illustrate the application of the latter by reports on a compositional analysis of perovskite oxides and on an investigation of nanoscaled multilayer structures.

Article  |  Issue 21/4 (2009)

Combined infrared and visible spectroscopic ellipsometry study of thin polymer layers

K. Hinrichs, K. J. Eichhorn

Thin polymer layers on solid substrates are of high technological importance due to their increasing potential for applications in electronics, sensors, nanotechnology and biotechnology. Appropriate characterisation methods are necessary for the design and analysis of devices made using such materials. This review article focuses upon presenting the many analytical possibilities for quantitative evaluation of the optical constants and thickness of polymer layers by combined application of spectroscopic ellipsometry (SE) in the visible (vis) and infrared (IR) spectral range.

Article  |  Issue 19/6 (2007)

Quantitative surface chemical microscopy by X-ray photoelectron spectroscopy

John Walton

John Walton

Surface Analysis Coordinator, School of Materials, The University of Manchester, PO Box 88, Manchester, M60 1QD, UK. E-mail: john.walton@manchester.ac.uk, Web: personalpages.manchester.ac.uk/staff/john.walton

Article  |  Issue 19/6 (2007)

The contributions of surface analysis to adhesion research

John F. Watts

Surrey Materials Institute and School of Engineering, University of Surrey, Guildford, Surrey GU2 7XH, UK. E-mail: j.watts@surrey.ac.uk

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Organic and molecular imaging by ToF-SIMS: at the cutting edge

Alan J. Paul

CSMA, CERAM, Queens Road, Stoke-on-Trent, ST4 7LQ, UK

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Study of annatto from Bixa orellana seeds: an application of time-of-flight secondary ion mass spectrometry

Carla Bittencourt, Marcella P. Felicissimo, Jean-Jacques Pireaux and Laurent Houssiau

Laboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Facultés Universitaires Notre-Dame de la Paix, University of Namur, 61 rue de Bruxelles, B-5000 Namur, Belgium

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Unlocking the secrets of ancient glass technology using ToF-SIMS

Frank Rutten,* Julian Hendersona and David Briggs

School of Pharmacy and Centre for Surface Chemical Analysis,
aDepartment of Archaeology, School of Humanities, University of Nottingham, University Park, Nottingham NG7 2RD, UK
*Correspondence to: Frank Rutten, School of Pharmacy, University of Nottingham University Park, Nottingham NG7 2RD, UK. E-mail: frank.rutten@nottingham.ac.uk

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XPS surface analysis: imaging and spectroscopy of metal and polymer surfaces

Antonella Rossi,a,b Bernhard Elsenera and Nicholas D. Spencerb

aDepartment of Inorganic and Analytical Chemistry, University of Cagliari, Campus of Monserrato, 09100 Cagliari, Italy

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Cation mass spectrometry: towards an optimisation of SIMS analyses performed in the MCsx+ mode

T. Wirtz and H.-N. Migeon

Laboratoire d’Analyse des Matériaux, Centre de Recherche Public - Gabriel Lippmann, 162A, av. de la Faïencerie, L-1511 Luxembourg, wirtzt@crpgl.lu

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Chemical imaging of pharmaceuticals by time-of-flight secondary ion mass spectrometry

S.Y. Luk,a N. Patela and M.C. Daviesb

aMolecular Profiles Ltd, 1 Faraday Building, Nottingham Science & Technology Park, University Boulevard, Nottingham NG7 2QP, UK. E-mail: sluk@molprofiles.co.uk
bLaboratory of Biophysics and Surface Analysis, School of Pharmaceutical Sciences, University of Nottingham, Nottingham NG7 2RD, UK

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