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Handheld XRF spectrometer with graphene window SDD

6 June 2018 | Product
by Ian Michael

Bruker has introduced the TRACER 5g handheld X-ray fluorescence (XRF) elemental analyser, incorporating a silicon drift detector (SDD) with a graphene entrance window. The graphene window has higher transmission of X-rays throughout the energy spectrum and improves the transmission for light elements such as sodium (Na), magnesium (Mg), silicon (Si) and aluminium (Al). This improved light element sensitivity enables new applications for handheld XRF in the fields of geology, agriculture and material science. The TRACER 5g can achieve detection limits as low as 275 ppm for Na and 100 ppm for Mg when the operated with helium purge. The TRACER 5g retains all the features from the TRACER 5i, including integrated software with complete user control of the excitation, a choice of excitation collimators and filters, the ability to operate in air, vacuum or helium atmosphere, as well as the suite of powerful PC software, including Artax™ and EasyCal™, that is supplied with the instrument.