Exhibition Reports

Analytica Report 2016

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In the last issue, I reported on many new products introduced at Pittcon. This time, I’ve been to Analytica in Munich, Germany. Whilst many of the new products there had already been seen at Pittcon (and so are not included again), there was still plenty of new instrumentation. We also have a short New Products section and a Product Focus on Imaging Spectroscopy.

Read more: Analytica Report 2016


Pittcon 2016 Report

Pittcon-2016-LogoNew spectroscopy releases at Pittcon 2016, along with links to further information.

Read more: Pittcon 2016 Report



The annual report on new product introductions at Pittcon. The miniaturisation of spectrometers continues, with increasing use of MEMS-based instruments bringing the potential for “ultramobile” instruments, as well as improved consistency and economies of scale in manufacture. Wearable spectroscopy is already here and it will not be long before we see significant use of spectroscopy for consumer devices and in or on our mobile phones.

Read more: PITTCON 2015




FAST SDD with Moisture Resistant Windows

Amptek’s line of silicon drift detectors is now available for use for energy dispersive spectroscopy (EDS) within scanning electron microscopes (SEMs). With the “C Series” silicon nitride X-ray windows, the low-energy response extends down to boron. SEM-EDS is an ideal application for these detectors because the electrons have a short range in the sample and they excite the X-rays very close to the surface, yielding many X-rays from all the elements down to carbon, benefitting from the high efficiency of these windows at low energies.



S2 Puma

Bench-top ED XRF spectrometer suitable for industrial applications, where the 20-position sample tray or automation interface to a conveyor belt will be valuable, or as a flexible tool for the academic and research environment, since it can accept a wide range of sample types, shapes and sizes. The measurement spot can be changed from a couple of centimetres to a few millimetres, and a video camera aids exact sample positioning.


D8 Endeavor

Process XRD system for analysis of polycrystalline material that succeeds the D4 Endeavor. 1-dimensional detector technology enables short measurement times whilst maintaining sensitivity for the detection of crystallographic phases with low concentrations. Conveyor belt or external robot interface are available for automated sample loading, and measurement can continue whilst single samples or sample trays are loaded manually.



JSX-1000S ElementEye

ED XRF spectrometer that enables high-sensitivity analyses to be performed across the entire energy range using a maximum of nine types of filters and a sample chamber vacuum unit. It has a 12-position auto sample changer, touch screen operation, pre-recorded recipes for standard solution applications (RoHS, metals, oxides, organic materials), a high sensitivity SDD and short-path optical system for high throughput, and residual balance and thickness correction for organic samples.


Navas Instruments

AFS-5000 Series

Fusion system for making beads for XRF analysis that incorporates a loss-on-ignition (LOI) analyser. An external balance weighs the crucible, sample and flux, and an internal balance below the furnace that is used for LOI calculations. This simplifies the bead making process and makes it less dependent on the individual operator. Versions are available to handle form two to eight beads, and expansion is easily.




X-ray fluorescence spectrometer that has both wavelength dispersive and energy dispersive cores integrated by SumXcore technology in one instrument, which can also include a small spot analysis tool for fast element distribution mapping and the THETA free lime channel for dedicated cement applications. Measuring ED and WD simultaneously cuts the experimental time in half. A series of dedicated Zetium editions are available: cement, polymers, petro, metals and minerals, as well as an “Ultimate” edition. Each is available with a choice of four enhanced performance packages for improved speed and throughput, performance enhancement, robustness and uptime, and flexibility.



New detector for X-ray diffraction with resolution comparable to the PIXcel3D and with pixel dimensions of 60 × 60 µm and overall sensor dimension of 30.7 × 24.8 mm. The CdTe sensor provides high stopping power for X-rays, improving the detector efficiency for all laboratory wavelengths, and enabling close to 100% efficiency for higher radiation such as Ag and Mo.



NEX QC Quant EZ Series

Low-cost, high-resolution bench-top ED XRF analysers designed for heavy industrial use. QuantEZ analytical software runs on either a laptop or benchtop PC and offers all the functions required for calibration and routine maintenance. The NEX QC QuantEZ version is optimised for routine QC and the NEX QC+ QuantEZ version for more demanding applications where analysis time and sample throughput are important. The QC+ uses silicon drift detector technology.




Ibsen Photonics

Freedom HR

Range of OEM spectrometers in UV, Vis and NIR versions, with resolutions down to 0.2 nm in the UV, 0.4 nm in the Vis and 0.6 nm in the NIR and a size of 61 × 64 × 19 mm. The series incorporates Ibsen’s high groove density master transmission gratings which are made from pure fused silica.




A special configuration of the V-700 series of UV/Vis/NIR spectrophotometers with a monochromator with automatically exchanged dual gratings: 1200 lines/mm for the UV/Vis; 600 lines/mm for the NIR. A PMT detector is provided for the UV/Vis and an InGaAs photodiode detector for the NIR. Both gratings and detectors are automatically exchanged within the user-selectable 800–900 nm range with higher resolution settings with enhanced sensitivity in the NIR.


Ocean Optics


Miniature spectrometer that provides high thermal stability and low unit-to-unit variation whilst maintaining flexibility and configurability. Fully configurable over the 190–1100 nm wavelength range. Features such as interchangeable slits, indicator LEDs and simpler device connectors are included. It has a footprint of 89 × 63 × 34 mm and weight of 265 g.



First Ocean Optics’ spectral device to use a solid-state optical encoder instead of a diffraction grating. Wavelength range is 380–700 nm and available in both OEM and standalone versions, it is suitable for simple absorbance, fluorescence and emissive colour measurements. A range of Spark accessories, including clip-on cuvette holders, diffusers and light sources is compatible with both versions.




Multi-purpose UV/vis spectrophotometer with wavelength scanning from 190 nm to 1100 nm along with intuitive operation, enhanced validation, maintenance and inspection functions. It has seven measurement modes including photometric, spectral, kinetics, DNA/protein and multi-component quantitation. USB flash drives can be connected to the instrument to transfer analysis data.




Portable visible absorption spectrometer with a wavelength range of 430–720 nm. SpectroClick’s instruments use their stacked gratings technology.


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